Abstract
The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.
| Original language | English |
|---|---|
| Pages (from-to) | 344-346 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 85 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Jul 12 2004 |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy. / Pingree, L. S C; Hersam, Mark C; Kern, M. M.; Scott, B. J.; Marks, Tobin J.
In: Applied Physics Letters, Vol. 85, No. 2, 12.07.2004, p. 344-346.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy
AU - Pingree, L. S C
AU - Hersam, Mark C
AU - Kern, M. M.
AU - Scott, B. J.
AU - Marks, Tobin J
PY - 2004/7/12
Y1 - 2004/7/12
N2 - The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.
AB - The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.
UR - http://www.scopus.com/inward/record.url?scp=3242877127&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=3242877127&partnerID=8YFLogxK
U2 - 10.1063/1.1765206
DO - 10.1063/1.1765206
M3 - Article
VL - 85
SP - 344
EP - 346
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 2
ER -