Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

L. S.C. Pingree; M. C. Hersam; M. M. Kern; B. J. Scott; T. J. Marks

doi:10.1063/1.1765206

Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

L. S.C. Pingree, M. C. Hersam, M. M. Kern, B. J. Scott, T. J. Marks

Northwestern University

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.

Original language	English
Pages (from-to)	344-346
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	2
DOIs	https://doi.org/10.1063/1.1765206
Publication status	Published - Jul 12 2004

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy",

abstract = "The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.",

author = "Pingree, {L. S.C.} and Hersam, {M. C.} and Kern, {M. M.} and Scott, {B. J.} and Marks, {T. J.}",

note = "Funding Information: The authors thank He Yan and Qinglan Huang for their invaluable insight. This work was supported by the NASA Institute for Nanoelectronics and Computing under Award No. NCC 2-1363 and the NSF under Award No. DMR-0134706. Use of characterization facilities supported by the Northwestern University MRSEC (NSF DMR-0076097) is acknowledged. Copyright: Copyright 2012 Elsevier B.V., All rights reserved.",

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doi = "10.1063/1.1765206",

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AU - Hersam, M. C.

AU - Kern, M. M.

AU - Scott, B. J.

AU - Marks, T. J.

N1 - Funding Information: The authors thank He Yan and Qinglan Huang for their invaluable insight. This work was supported by the NASA Institute for Nanoelectronics and Computing under Award No. NCC 2-1363 and the NSF under Award No. DMR-0134706. Use of characterization facilities supported by the Northwestern University MRSEC (NSF DMR-0076097) is acknowledged. Copyright: Copyright 2012 Elsevier B.V., All rights reserved.

PY - 2004/7/12

Y1 - 2004/7/12

N2 - The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.

AB - The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.

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Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

Abstract

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