Abstract
The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.
| Original language | English |
|---|---|
| Pages (from-to) | 344-346 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 85 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Jul 12 2004 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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Pingree, L. S. C., Hersam, M. C., Kern, M. M., Scott, B. J., & Marks, T. J. (2004). Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy. Applied Physics Letters, 85(2), 344-346. https://doi.org/10.1063/1.1765206