Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

L. S C Pingree, Mark C Hersam, M. M. Kern, B. J. Scott, Tobin J Marks

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.

Original languageEnglish
Pages (from-to)344-346
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number2
DOIs
Publication statusPublished - Jul 12 2004

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electroluminescence
light emitting diodes
atomic force microscopy
nanotubes
topography
nanowires
fabrication
evaluation

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy. / Pingree, L. S C; Hersam, Mark C; Kern, M. M.; Scott, B. J.; Marks, Tobin J.

In: Applied Physics Letters, Vol. 85, No. 2, 12.07.2004, p. 344-346.

Research output: Contribution to journalArticle

@article{0d3fa6eb00c24e63940a1d915a91cddb,
title = "Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy",
abstract = "The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.",
author = "Pingree, {L. S C} and Hersam, {Mark C} and Kern, {M. M.} and Scott, {B. J.} and Marks, {Tobin J}",
year = "2004",
month = "7",
day = "12",
doi = "10.1063/1.1765206",
language = "English",
volume = "85",
pages = "344--346",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "2",

}

TY - JOUR

T1 - Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

AU - Pingree, L. S C

AU - Hersam, Mark C

AU - Kern, M. M.

AU - Scott, B. J.

AU - Marks, Tobin J

PY - 2004/7/12

Y1 - 2004/7/12

N2 - The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.

AB - The use of conductive atomic force microscopy (cAFM) technique for monitoring topography, charge transport and electroluminescence of organic light-emitting diodes (OLED) was analyzed. The cAFM technique was found to be suited for probing the electroluminescent response of OLEDs over short length scales. The cAFM strategy allowed straightforward electrical and optical evaluation after OLEDs fabrication. The results show that the cAFM technique was used for characterizing electroluminescence from semiconducting nanowires, nanotubes and optoelectonic devices.

UR - http://www.scopus.com/inward/record.url?scp=3242877127&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=3242877127&partnerID=8YFLogxK

U2 - 10.1063/1.1765206

DO - 10.1063/1.1765206

M3 - Article

VL - 85

SP - 344

EP - 346

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 2

ER -