Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

B. J. Leever, M. F. Durstock, M. D. Irwin, A. W. Hains, Tobin J Marks, L. S C Pingree, Mark C Hersam

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Original languageEnglish
Article number013302
JournalApplied Physics Letters
Volume92
Issue number1
DOIs
Publication statusPublished - 2008

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photocurrents
microscopy
atomic force microscopy
butyric acid
short circuit currents
esters
flexibility
inhomogeneity
solar cells
probes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy. / Leever, B. J.; Durstock, M. F.; Irwin, M. D.; Hains, A. W.; Marks, Tobin J; Pingree, L. S C; Hersam, Mark C.

In: Applied Physics Letters, Vol. 92, No. 1, 013302, 2008.

Research output: Contribution to journalArticle

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