Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

B. J. Leever, M. F. Durstock, M. D. Irwin, A. W. Hains, T. J. Marks, L. S.C. Pingree, M. C. Hersam

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Original languageEnglish
Article number013302
JournalApplied Physics Letters
Volume92
Issue number1
DOIs
Publication statusPublished - Jan 16 2008

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy'. Together they form a unique fingerprint.

  • Cite this