Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

B. J. Leever, M. F. Durstock, M. D. Irwin, A. W. Hains, T. J. Marks, L. S.C. Pingree, M. C. Hersam

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A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Original languageEnglish
Article number013302
JournalApplied Physics Letters
Issue number1
Publication statusPublished - Jan 16 2008


ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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