Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films

G. Evmenenko, M. E. Van der Boom, C. J. Yu, J. Kmetko, P. Dutta

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Nanometer-scale thick liquid films of poly(methylhydro-dimethyl)siloxane copolymer (PMDMS) deposited on hydrophilic and hydrophobic solid organic films have been studied using synchrotron X-ray specular reflectivity (XRR). The physico-chemical properties of liquid PMDMS at the interfacial level are controlled by the nature of the solid surface. Detailed analysis of the XRR-data revealed the formation of a low-density region in the liquid PMDMS film in the vicinity of the hydrophobic surface, whereas a densely packed molecular layer is formed at the liquid PMDMS-hydrophilic substrate interface. Non-covalent polymer chains are 'frozen' at the solid-liquid interfaces in the confined liquid films and interactions with the substrate surfaces (i.e. hydrogen bonding) are responsible for distinctly different density profiles.

Original languageEnglish
Pages (from-to)1051-1056
Number of pages6
JournalPolymer
Volume44
Issue number4
DOIs
Publication statusPublished - Jan 17 2003

Keywords

  • Solid/liquid interface
  • Specular X-ray reflectivity
  • Thin liquid films

ASJC Scopus subject areas

  • Organic Chemistry
  • Polymers and Plastics
  • Materials Chemistry

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