Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers

A. Malik, W. Lin, M. K. Durbin, Tobin J Marks, P. Dutta

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Specular x-ray reflectivity has been used to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane-based self-assembly technique that is repeated to form periodic multilayers. In films containing up to ten trilayers, it is found that the film thickness increases linearly as a function of the number of trilayers with no observable change in the surface roughness. Bragg peaks corresponding to the inter-trilayer spacing are observed. Both of these results indicate high structural regularity in these self-assembled multilayers. In self-assembled films with different constituent molecular building blocks, substantial and unexpected changes in the film structure occur as a result of subtle changes in the layers.

Original languageEnglish
Pages (from-to)645-652
Number of pages8
JournalJournal of Chemical Physics
Volume107
Issue number2
Publication statusPublished - Jul 8 1997

Fingerprint

Multilayers
reflectance
X rays
microstructure
Microstructure
Siloxanes
x rays
siloxanes
Self assembled monolayers
regularity
Self assembly
Film thickness
self assembly
surface roughness
film thickness
Surface roughness
spacing
probes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers. / Malik, A.; Lin, W.; Durbin, M. K.; Marks, Tobin J; Dutta, P.

In: Journal of Chemical Physics, Vol. 107, No. 2, 08.07.1997, p. 645-652.

Research output: Contribution to journalArticle

Malik, A. ; Lin, W. ; Durbin, M. K. ; Marks, Tobin J ; Dutta, P. / Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers. In: Journal of Chemical Physics. 1997 ; Vol. 107, No. 2. pp. 645-652.
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