Specular x-ray reflectivity study of ordering in self-assembled organic and hybrid organic-inorganic electro-optic multilayer films

G. Evmenenko, Milko van der Boom, J. Kmetko, S. W. Dugan, Tobin J Marks, P. Dutta

Research output: Contribution to journalArticle

42 Citations (Scopus)

Abstract

The microstructures of siloxane-based self-assembled electro-optic superlattices composed of high-hyperpolarizable organic chromophore arrays intercalated with Ga and In oxide sheets were analyzed. The film thickness increased linearly as a function of the number of layers, underscoring the high structural regularity and efficiency of the synthetic approach. The dependence of the relative surface roughness on the number of layers was found to be identical for self-assembled organic and organic-inorganic hybrid film structures. The solution-based deposition of Ga and In metal oxide layers was found to be suitable for nanometer scale film construction, and enables tunable, metal-dependent modification of feasible superlattice physicochemical properties.

Original languageEnglish
Pages (from-to)6722-6727
Number of pages6
JournalJournal of Chemical Physics
Volume115
Issue number14
DOIs
Publication statusPublished - Oct 8 2001

Fingerprint

Multilayer films
Electrooptical effects
Oxides
electro-optics
Metals
Siloxanes
reflectance
X rays
Superlattices
Chromophores
Film thickness
x rays
Surface roughness
siloxanes
regularity
chromophores
Microstructure
metal oxides
superlattices
surface roughness

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Specular x-ray reflectivity study of ordering in self-assembled organic and hybrid organic-inorganic electro-optic multilayer films. / Evmenenko, G.; van der Boom, Milko; Kmetko, J.; Dugan, S. W.; Marks, Tobin J; Dutta, P.

In: Journal of Chemical Physics, Vol. 115, No. 14, 08.10.2001, p. 6722-6727.

Research output: Contribution to journalArticle

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