Spin-Polarized Band-Structure Determination of the Si2 Molecular Ground State by the Method of Full-Potential Linearized Augmented Plane Waves

M. Weinert, E. Wimmer, Arthur J Freeman, H. Krakauer

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

An electronic band-structure investigation of the charge topology and the eigenvalue spectrum of the Si2 molecule is presented with use of the full-potential linearized augmented plane-wave method for thin films. The inclusion of spin polarization is found to be of fundamental importance in order to obtain the correct description of the ground state (paramagnetic calculations do not converge to any ground state) and to elucidate earlier controversies.

Original languageEnglish
Pages (from-to)705-708
Number of pages4
JournalPhysical Review Letters
Volume47
Issue number10
DOIs
Publication statusPublished - 1981

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plane waves
ground state
eigenvalues
topology
inclusions
polarization
thin films
electronics
molecules

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Spin-Polarized Band-Structure Determination of the Si2 Molecular Ground State by the Method of Full-Potential Linearized Augmented Plane Waves. / Weinert, M.; Wimmer, E.; Freeman, Arthur J; Krakauer, H.

In: Physical Review Letters, Vol. 47, No. 10, 1981, p. 705-708.

Research output: Contribution to journalArticle

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