Strctures and properties of ZnO/SnO2-cosubstituted in 2O3 films

M. Zhang, S. J. Xie, D. B. Buchholz, R. P H Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Zn0.3In1.4Sn0.3O3-δ (ZITO) thin films have been grown at 700°C by computer-controlled pulsed laser deposition (PLD) on both (0001) Al2O3 and (111) YSZ substrates. Cross-section and plan-view transmission electron microscopy (TEM) revealed that ihe ZITO films on (0001) Al2O3 substrate were composed of twin-related domains with a lattice mismatch of approximately 2.8%. While ZITO films on (111) YSZ substrates have a cubic-on-cubic orientation relationship with a lattice mismatch of approximately -1.5%. Lower electrical conductivity and higher optical transparency were found in the ZITO films on the well lattice-matched YSZ substrates than those on Al2O3 substrate. Formation of self-patterned nanocrystals (NCs) in the ZITO film with indium and tin enrichment in the NCs are attributed to more electron-scattering centers and electron traps in the ZITO films on YSZ substrate.

Original languageEnglish
Title of host publicationTMS Annual Meeting
Pages245-250
Number of pages6
Volume1
Publication statusPublished - 2008
EventTMS 2008 Annual Meeting Supplemental: Materials Processing and Properties - New Orleans, LA, United States
Duration: Mar 9 2008Mar 13 2008

Other

OtherTMS 2008 Annual Meeting Supplemental: Materials Processing and Properties
CountryUnited States
CityNew Orleans, LA
Period3/9/083/13/08

Fingerprint

yttria-stabilized zirconia
Substrates
Lattice mismatch
Nanocrystals
nanocrystals
Electron traps
Indium
Electron scattering
Tin
Pulsed laser deposition
Transparency
pulsed laser deposition
indium
tin
electron scattering
traps
Transmission electron microscopy
Thin films
transmission electron microscopy
electrical resistivity

Keywords

  • Charge transport and optical transparency
  • Transmission electron microscopy
  • Transparent conducting oxide thin films

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys

Cite this

Zhang, M., Xie, S. J., Buchholz, D. B., & Chang, R. P. H. (2008). Strctures and properties of ZnO/SnO2-cosubstituted in 2O3 films. In TMS Annual Meeting (Vol. 1, pp. 245-250)

Strctures and properties of ZnO/SnO2-cosubstituted in 2O3 films. / Zhang, M.; Xie, S. J.; Buchholz, D. B.; Chang, R. P H.

TMS Annual Meeting. Vol. 1 2008. p. 245-250.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, M, Xie, SJ, Buchholz, DB & Chang, RPH 2008, Strctures and properties of ZnO/SnO2-cosubstituted in 2O3 films. in TMS Annual Meeting. vol. 1, pp. 245-250, TMS 2008 Annual Meeting Supplemental: Materials Processing and Properties, New Orleans, LA, United States, 3/9/08.
Zhang M, Xie SJ, Buchholz DB, Chang RPH. Strctures and properties of ZnO/SnO2-cosubstituted in 2O3 films. In TMS Annual Meeting. Vol. 1. 2008. p. 245-250
Zhang, M. ; Xie, S. J. ; Buchholz, D. B. ; Chang, R. P H. / Strctures and properties of ZnO/SnO2-cosubstituted in 2O3 films. TMS Annual Meeting. Vol. 1 2008. pp. 245-250
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