Abstract
We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramifications for possible device application are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 122-126 |
| Number of pages | 5 |
| Journal | Chemistry of Materials |
| Volume | 6 |
| Issue number | 2 |
| Publication status | Published - 1994 |
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ASJC Scopus subject areas
- Materials Chemistry
- Materials Science(all)
Cite this
Structural characterization of self-assembled multilayers by FTIR. / Bent, Stacey F.; Schilling, Marcia L.; Wilson, William L.; Katz, Howard E.; Harris, Alex.
In: Chemistry of Materials, Vol. 6, No. 2, 1994, p. 122-126.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Structural characterization of self-assembled multilayers by FTIR
AU - Bent, Stacey F.
AU - Schilling, Marcia L.
AU - Wilson, William L.
AU - Katz, Howard E.
AU - Harris, Alex
PY - 1994
Y1 - 1994
N2 - We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramifications for possible device application are discussed.
AB - We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramifications for possible device application are discussed.
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UR - http://www.scopus.com/inward/citedby.url?scp=0000995848&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0000995848
VL - 6
SP - 122
EP - 126
JO - Chemistry of Materials
JF - Chemistry of Materials
SN - 0897-4756
IS - 2
ER -