Abstract
We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramifications for possible device application are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 122-126 |
| Number of pages | 5 |
| Journal | Chemistry of Materials |
| Volume | 6 |
| Issue number | 2 |
| Publication status | Published - 1994 |
ASJC Scopus subject areas
- Materials Chemistry
- Materials Science(all)
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Bent, S. F., Schilling, M. L., Wilson, W. L., Katz, H. E., & Harris, A. (1994). Structural characterization of self-assembled multilayers by FTIR. Chemistry of Materials, 6(2), 122-126.