Structural characterization of self-assembled multilayers by FTIR

Stacey F. Bent, Marcia L. Schilling, William L. Wilson, Howard E. Katz, Alex Harris

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We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramifications for possible device application are discussed.

Original languageEnglish
Pages (from-to)122-126
Number of pages5
JournalChemistry of Materials
Issue number2
Publication statusPublished - 1994

ASJC Scopus subject areas

  • Materials Chemistry
  • Materials Science(all)

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    Bent, S. F., Schilling, M. L., Wilson, W. L., Katz, H. E., & Harris, A. (1994). Structural characterization of self-assembled multilayers by FTIR. Chemistry of Materials, 6(2), 122-126.