Structural characterization of self-assembled multilayers by FTIR

Stacey F. Bent, Marcia L. Schilling, William L. Wilson, Howard E. Katz, Alex Harris

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramifications for possible device application are discussed.

Original languageEnglish
Pages (from-to)122-126
Number of pages5
JournalChemistry of Materials
Volume6
Issue number2
Publication statusPublished - 1994

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Organophosphonates
Zirconium
Multilayers
Anchors
Silicon
Hydrocarbons
Infrared spectroscopy
Etching
Degradation
Substrates

ASJC Scopus subject areas

  • Materials Chemistry
  • Materials Science(all)

Cite this

Bent, S. F., Schilling, M. L., Wilson, W. L., Katz, H. E., & Harris, A. (1994). Structural characterization of self-assembled multilayers by FTIR. Chemistry of Materials, 6(2), 122-126.

Structural characterization of self-assembled multilayers by FTIR. / Bent, Stacey F.; Schilling, Marcia L.; Wilson, William L.; Katz, Howard E.; Harris, Alex.

In: Chemistry of Materials, Vol. 6, No. 2, 1994, p. 122-126.

Research output: Contribution to journalArticle

Bent, SF, Schilling, ML, Wilson, WL, Katz, HE & Harris, A 1994, 'Structural characterization of self-assembled multilayers by FTIR', Chemistry of Materials, vol. 6, no. 2, pp. 122-126.
Bent SF, Schilling ML, Wilson WL, Katz HE, Harris A. Structural characterization of self-assembled multilayers by FTIR. Chemistry of Materials. 1994;6(2):122-126.
Bent, Stacey F. ; Schilling, Marcia L. ; Wilson, William L. ; Katz, Howard E. ; Harris, Alex. / Structural characterization of self-assembled multilayers by FTIR. In: Chemistry of Materials. 1994 ; Vol. 6, No. 2. pp. 122-126.
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