Synchrotron x-ray diffraction has been used to analyze the (3×3)R30°reconstruction of B/Si(111). Excellent agreement is obtained with in-plane data for a model in which boron sits in every third site of threefold symmetry. Out-of-plane diffraction, however, is only consistent with boron below the surface in the fivefold-coordinated substitutional site under a silicon T4 adatom. The structure is confirmed by the growth behavior under room-temperature Si deposition in which the silicon adatom is displaced from its ordered site leaving boron in a two-dimensional ordered substitutional array.
ASJC Scopus subject areas
- Physics and Astronomy(all)