Study of depth-dependent radiation-induced defects using coherent acoustic phonon spectroscopy

A. Steigerwald, J. Gregory, K. Varga, A. B. Hmelo, X. Liu, J. K. Furdyna, Leonard C Feldman, N. Tolk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Here we study the effect of radiation-induced point defect distributions on the optical reflectivity signal in GaAs using coherent acoustic phonon spectroscopy. We demonstrate that the presence of point defects significantly modifies the optical response, allowing estimation of the depth-dependent defect distribution in a nondestructive and noninvasive manner. We show that the observed changes are dependent on defect-induced changes to the electronic structure, namely defect-induced band tailing of the direct 1.43eV band edge. This provides a method for subsurface investigations on the complex interaction between different defects species and optoelectronic structure.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
Pages67-73
Number of pages7
Volume1363
DOIs
Publication statusPublished - 2011
Event2011 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 25 2011Apr 29 2011

Other

Other2011 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/25/114/29/11

Fingerprint

Acoustics
Spectroscopy
Radiation
Defects
acoustics
defects
Point defects
radiation
point defects
spectroscopy
Tailings
Optoelectronic devices
Electronic structure
electronic structure
reflectance
interactions

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Steigerwald, A., Gregory, J., Varga, K., Hmelo, A. B., Liu, X., Furdyna, J. K., ... Tolk, N. (2011). Study of depth-dependent radiation-induced defects using coherent acoustic phonon spectroscopy. In Materials Research Society Symposium Proceedings (Vol. 1363, pp. 67-73) https://doi.org/10.1557/opl.2011.1427

Study of depth-dependent radiation-induced defects using coherent acoustic phonon spectroscopy. / Steigerwald, A.; Gregory, J.; Varga, K.; Hmelo, A. B.; Liu, X.; Furdyna, J. K.; Feldman, Leonard C; Tolk, N.

Materials Research Society Symposium Proceedings. Vol. 1363 2011. p. 67-73.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Steigerwald, A, Gregory, J, Varga, K, Hmelo, AB, Liu, X, Furdyna, JK, Feldman, LC & Tolk, N 2011, Study of depth-dependent radiation-induced defects using coherent acoustic phonon spectroscopy. in Materials Research Society Symposium Proceedings. vol. 1363, pp. 67-73, 2011 MRS Spring Meeting, San Francisco, CA, United States, 4/25/11. https://doi.org/10.1557/opl.2011.1427
Steigerwald A, Gregory J, Varga K, Hmelo AB, Liu X, Furdyna JK et al. Study of depth-dependent radiation-induced defects using coherent acoustic phonon spectroscopy. In Materials Research Society Symposium Proceedings. Vol. 1363. 2011. p. 67-73 https://doi.org/10.1557/opl.2011.1427
Steigerwald, A. ; Gregory, J. ; Varga, K. ; Hmelo, A. B. ; Liu, X. ; Furdyna, J. K. ; Feldman, Leonard C ; Tolk, N. / Study of depth-dependent radiation-induced defects using coherent acoustic phonon spectroscopy. Materials Research Society Symposium Proceedings. Vol. 1363 2011. pp. 67-73
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