Subnanometer imaging of adsorbate-induced electronic structure perturbation on silicon surfaces

N. P. Guisinger, N. L. Yoder, S. P. Elder, Mark C Hersam

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Room-temperature scanning tunneling microscopy is utilized to explore the consequences of a single covalent bond formed between an organic molecule, 2,2,6,6-tetramethyl-1-piperidinyloxy (TEMPO), and the Si(111)-7 × 7 surface at the atomic scale. Upon binding, both topographic imaging and spectroscopic techniques reveal significant charge rearrangement within the substrate that is delocalized from the organic adsorbate. With scanning tunneling spectroscopy, the spatial extent of this charge transfer is directly visualized and determined to extend up to 2 nm from the molecule predominately within half of the Si(111)-7 × 7 unit cell. Analysis of individual differential tunneling conductance spectra suggests that the charge transfer is mediated by the back-bonds of the silicon substrate.

Original languageEnglish
Pages (from-to)2116-2120
Number of pages5
JournalJournal of Physical Chemistry C
Volume112
Issue number6
DOIs
Publication statusPublished - Feb 14 2008

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Silicon
Adsorbates
Electronic structure
Charge transfer
charge transfer
electronic structure
Imaging techniques
perturbation
Molecules
Covalent bonds
covalent bonds
Scanning tunneling microscopy
silicon
Substrates
imaging techniques
scanning tunneling microscopy
molecules
Spectroscopy
Scanning
scanning

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Energy(all)

Cite this

Subnanometer imaging of adsorbate-induced electronic structure perturbation on silicon surfaces. / Guisinger, N. P.; Yoder, N. L.; Elder, S. P.; Hersam, Mark C.

In: Journal of Physical Chemistry C, Vol. 112, No. 6, 14.02.2008, p. 2116-2120.

Research output: Contribution to journalArticle

Guisinger, N. P. ; Yoder, N. L. ; Elder, S. P. ; Hersam, Mark C. / Subnanometer imaging of adsorbate-induced electronic structure perturbation on silicon surfaces. In: Journal of Physical Chemistry C. 2008 ; Vol. 112, No. 6. pp. 2116-2120.
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