Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca2Cu3Ox thin films by Auger electron spectroscopy

Enrico Ciliberto; Ignazio L. Fragalá; Graziella Malandrino; Geoffrey C. Allen; Charles M. Younes; Tobin J Marks; Darrin S. Richeson; Douglas L. Schulz

doi:10.1016/0040-6090(92)90865-9

Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl₂Ba₂Ca₂Cu₃O_x thin films by Auger electron spectroscopy

Enrico Ciliberto, Ignazio L. Fragalá, Graziella Malandrino, Geoffrey C. Allen, Charles M. Younes, Tobin J Marks, Darrin S. Richeson, Douglas L. Schulz

Northwestern University

Research output: Contribution to journal › Article

5 Citations (Scopus)

Abstract

The surface and bulk chemical compositions of as-deposited and annealed superconducting Tl₂Ba₂Ca₂Cu₃O_x thin films have been analyzed by Auger electron spectroscopy (AES). These films are prepared on yttria-stabilized zirconia single-crystal substrates by a combination of metal-organic chemical vapor deposition (MOCVD) and thallium vapor diffusion. BaCaCuO films are first prepared by MOCVD. Thallium is then incorporated into these films by annealing in the presence of a mixture of oxides (Tl₂O₃, BaO, CaO and CuO) of a specific composition. The as-deposited BaCaCuO films are found to be free of carbon in the interior region. AES depth-profiling experiments reveal consistent atomic homogeneity throughout both the as-deposited BaCaCuO films and the Tl vapor-diffused superconducting films. Apparent intergrowth observed at the substrate-film interface may be due to surface roughness.

Original language	English
Pages (from-to)	37-40
Number of pages	4
Journal	Thin Solid Films
Volume	216
Issue number	1
DOIs	https://doi.org/10.1016/0040-6090(92)90865-9
Publication status	Published - Aug 28 1992

ASJC Scopus subject areas

Surfaces, Coatings and Films
Condensed Matter Physics
Surfaces and Interfaces

Access to Document

10.1016/0040-6090(92)90865-9

Fingerprint Dive into the research topics of 'Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca2Cu3Ox thin films by Auger electron spectroscopy'. Together they form a unique fingerprint.

Cite this

Ciliberto, E., Fragalá, I. L., Malandrino, G., Allen, G. C., Younes, C. M., Marks, T. J., Richeson, D. S., & Schulz, D. L. (1992). Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl₂Ba₂Ca₂Cu₃O_x thin films by Auger electron spectroscopy. Thin Solid Films, 216(1), 37-40. https://doi.org/10.1016/0040-6090(92)90865-9

Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl₂Ba₂Ca₂Cu₃O_x thin films by Auger electron spectroscopy. / Ciliberto, Enrico; Fragalá, Ignazio L.; Malandrino, Graziella; Allen, Geoffrey C.; Younes, Charles M.; Marks, Tobin J; Richeson, Darrin S.; Schulz, Douglas L.

In: Thin Solid Films, Vol. 216, No. 1, 28.08.1992, p. 37-40.

Research output: Contribution to journal › Article

Ciliberto, Enrico ; Fragalá, Ignazio L. ; Malandrino, Graziella ; Allen, Geoffrey C. ; Younes, Charles M. ; Marks, Tobin J ; Richeson, Darrin S. ; Schulz, Douglas L. / Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl₂Ba₂Ca₂Cu₃O_x thin films by Auger electron spectroscopy. In: Thin Solid Films. 1992 ; Vol. 216, No. 1. pp. 37-40.

@article{d8bbed7151f0463c9b31cd4db0caf7d9,

title = "Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca2Cu3Ox thin films by Auger electron spectroscopy",

abstract = "The surface and bulk chemical compositions of as-deposited and annealed superconducting Tl2Ba2Ca2Cu3Ox thin films have been analyzed by Auger electron spectroscopy (AES). These films are prepared on yttria-stabilized zirconia single-crystal substrates by a combination of metal-organic chemical vapor deposition (MOCVD) and thallium vapor diffusion. BaCaCuO films are first prepared by MOCVD. Thallium is then incorporated into these films by annealing in the presence of a mixture of oxides (Tl2O3, BaO, CaO and CuO) of a specific composition. The as-deposited BaCaCuO films are found to be free of carbon in the interior region. AES depth-profiling experiments reveal consistent atomic homogeneity throughout both the as-deposited BaCaCuO films and the Tl vapor-diffused superconducting films. Apparent intergrowth observed at the substrate-film interface may be due to surface roughness.",

author = "Enrico Ciliberto and Fragal{\'a}, {Ignazio L.} and Graziella Malandrino and Allen, {Geoffrey C.} and Younes, {Charles M.} and Marks, {Tobin J} and Richeson, {Darrin S.} and Schulz, {Douglas L.}",

year = "1992",

month = aug,

day = "28",

doi = "10.1016/0040-6090(92)90865-9",

language = "English",

volume = "216",

pages = "37--40",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Surface and bulk analysis of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca2Cu3Ox thin films by Auger electron spectroscopy

AU - Ciliberto, Enrico

AU - Fragalá, Ignazio L.

AU - Malandrino, Graziella

AU - Allen, Geoffrey C.

AU - Younes, Charles M.

AU - Marks, Tobin J

AU - Richeson, Darrin S.

AU - Schulz, Douglas L.

PY - 1992/8/28

Y1 - 1992/8/28

N2 - The surface and bulk chemical compositions of as-deposited and annealed superconducting Tl2Ba2Ca2Cu3Ox thin films have been analyzed by Auger electron spectroscopy (AES). These films are prepared on yttria-stabilized zirconia single-crystal substrates by a combination of metal-organic chemical vapor deposition (MOCVD) and thallium vapor diffusion. BaCaCuO films are first prepared by MOCVD. Thallium is then incorporated into these films by annealing in the presence of a mixture of oxides (Tl2O3, BaO, CaO and CuO) of a specific composition. The as-deposited BaCaCuO films are found to be free of carbon in the interior region. AES depth-profiling experiments reveal consistent atomic homogeneity throughout both the as-deposited BaCaCuO films and the Tl vapor-diffused superconducting films. Apparent intergrowth observed at the substrate-film interface may be due to surface roughness.

AB - The surface and bulk chemical compositions of as-deposited and annealed superconducting Tl2Ba2Ca2Cu3Ox thin films have been analyzed by Auger electron spectroscopy (AES). These films are prepared on yttria-stabilized zirconia single-crystal substrates by a combination of metal-organic chemical vapor deposition (MOCVD) and thallium vapor diffusion. BaCaCuO films are first prepared by MOCVD. Thallium is then incorporated into these films by annealing in the presence of a mixture of oxides (Tl2O3, BaO, CaO and CuO) of a specific composition. The as-deposited BaCaCuO films are found to be free of carbon in the interior region. AES depth-profiling experiments reveal consistent atomic homogeneity throughout both the as-deposited BaCaCuO films and the Tl vapor-diffused superconducting films. Apparent intergrowth observed at the substrate-film interface may be due to surface roughness.

UR - http://www.scopus.com/inward/record.url?scp=0345978010&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0345978010&partnerID=8YFLogxK

U2 - 10.1016/0040-6090(92)90865-9

DO - 10.1016/0040-6090(92)90865-9

M3 - Article

AN - SCOPUS:0345978010

VL - 216

SP - 37

EP - 40

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1

ER -