Abstract
Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.
Original language | English |
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Pages (from-to) | 619-622 |
Number of pages | 4 |
Journal | Solid State Communications |
Volume | 44 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1982 |
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ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
Cite this
Surface effects in the valence band XPS spectrum of copper. / Steiner, P.; Hüfner, S.; Freeman, Arthur J; Wang, Ding sheng.
In: Solid State Communications, Vol. 44, No. 5, 1982, p. 619-622.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Surface effects in the valence band XPS spectrum of copper
AU - Steiner, P.
AU - Hüfner, S.
AU - Freeman, Arthur J
AU - Wang, Ding sheng
PY - 1982
Y1 - 1982
N2 - Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.
AB - Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.
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UR - http://www.scopus.com/inward/citedby.url?scp=0020205539&partnerID=8YFLogxK
U2 - 10.1016/0038-1098(82)90566-X
DO - 10.1016/0038-1098(82)90566-X
M3 - Article
AN - SCOPUS:0020205539
VL - 44
SP - 619
EP - 622
JO - Solid State Communications
JF - Solid State Communications
SN - 0038-1098
IS - 5
ER -