Surface effects in the valence band XPS spectrum of copper

P. Steiner, S. Hüfner, Arthur J Freeman, Ding sheng Wang

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.

Original languageEnglish
Pages (from-to)619-622
Number of pages4
JournalSolid State Communications
Volume44
Issue number5
DOIs
Publication statusPublished - 1982

Fingerprint

Valence bands
Copper
X ray photoelectron spectroscopy
Metals
valence
copper
Experiments
metals

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Surface effects in the valence band XPS spectrum of copper. / Steiner, P.; Hüfner, S.; Freeman, Arthur J; Wang, Ding sheng.

In: Solid State Communications, Vol. 44, No. 5, 1982, p. 619-622.

Research output: Contribution to journalArticle

Steiner, P. ; Hüfner, S. ; Freeman, Arthur J ; Wang, Ding sheng. / Surface effects in the valence band XPS spectrum of copper. In: Solid State Communications. 1982 ; Vol. 44, No. 5. pp. 619-622.
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