Surface effects in the valence band XPS spectrum of copper

P. Steiner; S. Hüfner; Arthur J Freeman; Ding sheng Wang

doi:10.1016/0038-1098(82)90566-X

Surface effects in the valence band XPS spectrum of copper

P. Steiner, S. Hüfner, Arthur J Freeman, Ding sheng Wang

Northwestern University

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.

Original language	English
Pages (from-to)	619-622
Number of pages	4
Journal	Solid State Communications
Volume	44
Issue number	5
DOIs	https://doi.org/10.1016/0038-1098(82)90566-X
Publication status	Published - 1982

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics

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Steiner, P., Hüfner, S., Freeman, A. J., & Wang, D. S. (1982). Surface effects in the valence band XPS spectrum of copper. Solid State Communications, 44(5), 619-622. https://doi.org/10.1016/0038-1098(82)90566-X

@article{e4ced1ee735f466c95d655c0b6312dce,

title = "Surface effects in the valence band XPS spectrum of copper",

abstract = "Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.",

author = "P. Steiner and S. H{\"u}fner and Freeman, {Arthur J} and Wang, {Ding sheng}",

year = "1982",

doi = "10.1016/0038-1098(82)90566-X",

language = "English",

volume = "44",

pages = "619--622",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Limited",

number = "5",

}

TY - JOUR

T1 - Surface effects in the valence band XPS spectrum of copper

AU - Steiner, P.

AU - Hüfner, S.

AU - Freeman, Arthur J

AU - Wang, Ding sheng

PY - 1982

Y1 - 1982

N2 - Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.

AB - Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.

UR - http://www.scopus.com/inward/record.url?scp=0020205539&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020205539&partnerID=8YFLogxK

U2 - 10.1016/0038-1098(82)90566-X

DO - 10.1016/0038-1098(82)90566-X

M3 - Article

AN - SCOPUS:0020205539

VL - 44

SP - 619

EP - 622

JO - Solid State Communications

JF - Solid State Communications

SN - 0038-1098

IS - 5

ER -