Surface effects in the valence band XPS spectrum of copper

P. Steiner; S. Hüfner; Arthur J Freeman; Ding sheng Wang

doi:10.1016/0038-1098(82)90566-X

Surface effects in the valence band XPS spectrum of copper

P. Steiner, S. Hüfner, Arthur J Freeman, Ding sheng Wang

Northwestern University

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

Comparison of valence band XPS spectra of Cu samples with theoretical density of states shows a high intensity near the upper edge of the d-band. This is a feature common for most d-band metals. However, if the difference in the density of states of the first two atomic layers with respect to the bulk is taken into account, good agreement between theory and experiment is found.

Original language	English
Pages (from-to)	619-622
Number of pages	4
Journal	Solid State Communications
Volume	44
Issue number	5
DOIs	https://doi.org/10.1016/0038-1098(82)90566-X
Publication status	Published - 1982

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ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics

Cite this

Steiner, P., Hüfner, S., Freeman, A. J., & Wang, D. S. (1982). Surface effects in the valence band XPS spectrum of copper. Solid State Communications, 44(5), 619-622. https://doi.org/10.1016/0038-1098(82)90566-X

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Access to Document

10.1016/0038-1098(82)90566-X