Surface electronic properties of polycrystalline bulk and thin film In 2O3(ZnO)k compounds

E. Mitchell Hopper, Qimin Zhu, Jürgen Gassmann, Andreas Klein, Thomas O Mason

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The surface electronic potentials of In2O3(ZnO) k compounds were measured by X-ray and ultraviolet photoelectron spectroscopy. Both thin film (k = 2) and bulk specimens (k = 3, 5, 7, 9) were studied. All bulk specimens exhibited In enrichment at the surface. All samples showed an increase of In core level binding energies compared to pure and Sn-doped In2O3. The work functions and Fermi levels spanned a range similar to those of the basis oxides In2O3 and ZnO, and the ionization potential was similar to that of both In 2O3 and ZnO processed under similar conditions (7.7 eV). This ionization potential was independent of both composition and post-deposition oxidation and reduction treatments. Kelvin probe measurements of cleaned and UV-ozone treated specimens under ambient conditions were in agreement with the photoelectron spectroscopy measurements.

Original languageEnglish
Pages (from-to)811-815
Number of pages5
JournalApplied Surface Science
Volume264
DOIs
Publication statusPublished - Jan 1 2013

Fingerprint

Ionization potential
Electronic properties
Ultraviolet photoelectron spectroscopy
Thin films
Core levels
Ozone
Photoelectron spectroscopy
Fermi level
Binding energy
Oxides
X ray photoelectron spectroscopy
Oxidation
Chemical analysis

Keywords

  • Indium zinc oxide
  • Ionization potential
  • Kelvin probe
  • Photoelectron spectroscopy
  • Work function

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Surface electronic properties of polycrystalline bulk and thin film In 2O3(ZnO)k compounds. / Hopper, E. Mitchell; Zhu, Qimin; Gassmann, Jürgen; Klein, Andreas; Mason, Thomas O.

In: Applied Surface Science, Vol. 264, 01.01.2013, p. 811-815.

Research output: Contribution to journalArticle

Hopper, E. Mitchell ; Zhu, Qimin ; Gassmann, Jürgen ; Klein, Andreas ; Mason, Thomas O. / Surface electronic properties of polycrystalline bulk and thin film In 2O3(ZnO)k compounds. In: Applied Surface Science. 2013 ; Vol. 264. pp. 811-815.
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