TETRAGONAL STRAIN IN MBE Ge//xSi//1// minus //x FILMS GROWN ON (100) Si OBSERVED BY ION CHANNELING AND X-RAY DIFFRACTION.

A. T. Fiory, Leonard C Feldman, J. C. Bean, I. K. Robinson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
Original languageEnglish
Title of host publicationMaterials Research Society Symposia Proceedings
PublisherNorth-Holland
Pages497-502
Number of pages6
Volume25
ISBN (Print)0444009051
Publication statusPublished - 1984

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Fiory, A. T., Feldman, L. C., Bean, J. C., & Robinson, I. K. (1984). TETRAGONAL STRAIN IN MBE Ge//xSi//1// minus //x FILMS GROWN ON (100) Si OBSERVED BY ION CHANNELING AND X-RAY DIFFRACTION. In Materials Research Society Symposia Proceedings (Vol. 25, pp. 497-502). North-Holland.