TETRAGONAL STRAIN IN MBE Ge//xSi//1// minus //x FILMS GROWN ON (100) Si OBSERVED BY ION CHANNELING AND X-RAY DIFFRACTION.

A. T. Fiory, Leonard C Feldman, J. C. Bean, I. K. Robinson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

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