Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy

Richard D. Schaller; Justin C. Johnson; Richard J. Saykally

doi:10.1002/cphc.200300907

Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy

Richard D. Schaller, Justin C. Johnson, Richard J. Saykally

Northwestern University, Argonne National Laboratory

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

Time and space-with high resolution: Time-resolved second harmonic generation (TRSHG) signals produced via photoexcitation of carriers in ZnSe exhibit different relaxation rates depending upon carrier proximity to an interface; these rates can be controlled via one-versus two-photon excitation. When combined with near-field scanning optical microscopy (NSOM; see graphic), which can provide <100 nm spatial resolution, TRSHG measurements show carrier relaxation rates that are more typical of relaxation in proximity to an interface, owing to the shallow depth of field that is characteristic of NSOM measurements.

Original language	English
Pages (from-to)	1243-1247
Number of pages	5
Journal	ChemPhysChem
Volume	4
Issue number	11
DOIs	https://doi.org/10.1002/cphc.200300907
Publication status	Published - Nov 14 2003

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Keywords

Nanotechnology
Near-field microscopy
Nonlinear optics
Second harmonic generation
Semiconductors
Time-resolved spectroscopy

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Physical and Theoretical Chemistry

Cite this

Schaller, R. D., Johnson, J. C., & Saykally, R. J. (2003). Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy. ChemPhysChem, 4(11), 1243-1247. https://doi.org/10.1002/cphc.200300907

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Access to Document

10.1002/cphc.200300907