Abstract
Time and space-with high resolution: Time-resolved second harmonic generation (TRSHG) signals produced via photoexcitation of carriers in ZnSe exhibit different relaxation rates depending upon carrier proximity to an interface; these rates can be controlled via one-versus two-photon excitation. When combined with near-field scanning optical microscopy (NSOM; see graphic), which can provide <100 nm spatial resolution, TRSHG measurements show carrier relaxation rates that are more typical of relaxation in proximity to an interface, owing to the shallow depth of field that is characteristic of NSOM measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 1243-1247 |
| Number of pages | 5 |
| Journal | ChemPhysChem |
| Volume | 4 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - Nov 14 2003 |
Keywords
- Nanotechnology
- Near-field microscopy
- Nonlinear optics
- Second harmonic generation
- Semiconductors
- Time-resolved spectroscopy
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
Fingerprint Dive into the research topics of 'Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy'. Together they form a unique fingerprint.
Cite this
Schaller, R. D., Johnson, J. C., & Saykally, R. J. (2003). Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy. ChemPhysChem, 4(11), 1243-1247. https://doi.org/10.1002/cphc.200300907