Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy

Richard D. Schaller, Justin C. Johnson, Richard J. Saykally

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Time and space-with high resolution: Time-resolved second harmonic generation (TRSHG) signals produced via photoexcitation of carriers in ZnSe exhibit different relaxation rates depending upon carrier proximity to an interface; these rates can be controlled via one-versus two-photon excitation. When combined with near-field scanning optical microscopy (NSOM; see graphic), which can provide <100 nm spatial resolution, TRSHG measurements show carrier relaxation rates that are more typical of relaxation in proximity to an interface, owing to the shallow depth of field that is characteristic of NSOM measurements.

Original languageEnglish
Pages (from-to)1243-1247
Number of pages5
JournalChemPhysChem
Volume4
Issue number11
DOIs
Publication statusPublished - Nov 14 2003

Keywords

  • Nanotechnology
  • Near-field microscopy
  • Nonlinear optics
  • Second harmonic generation
  • Semiconductors
  • Time-resolved spectroscopy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry

Access to Document

Fingerprint Dive into the research topics of 'Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy'. Together they form a unique fingerprint.

Cite this