Total dose radiation response of nitrided and non-nitrided SiO 2/4H-SiC MOS capacitors

Sriram K. Dixit, Sarit Dhar, John Rozen, Sanwu Wang, Ronald D. Schrimpf, Daniel M. Fleetwood, Sokrates T. Pantelides, John R. Williams, Leonard C. Feldman

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