Transmission electron microscopic characterization of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca1Cu2Oχ thin films on Au substrates. Evidence for Au-Cu alloy formation and texturing on a nonplanar metal substrate

Jieguang Hu, Dean J. Miller, Douglas L. Schulz, Bin Han, Deborah A. Neumayer, Bruce J. Hinds, Tobin J Marks

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6 Citations (Scopus)

Abstract

The microstructure of superconducting Tl2Ba2Ca1Cu2Oχ thin films grown on Au substrates by metal-organic chemical vapor deposition (MOCVD) has been investigated. Characterization techniques included X-ray diffraction, variable temperature magnetization, scanning and transmission electron microscopy (SEM and TEM, respectively) and energy dispersive X-ray spectroscopy (EDX) measurements. The films exhibit a magnetically derived Tc≈80 K and a high degree of texturing with the crystallite c-axis oriented perpendicular to the Au substrate surface as evidenced by enhanced (00l) X-ray diffraction reflections. SEM/ EDX and TEM/EDX provide evidence of Au-Cu alloy formation but no Au diffusion into the film. The superconducting grains exhibit good compositional uniformity and excellent alignment with the substrate, even though the Au substrates were not smooth and exhibited a moderate density of steps.

Original languageEnglish
Pages (from-to)97-105
Number of pages9
JournalPhysica C: Superconductivity and its Applications
Volume210
Issue number1-2
DOIs
Publication statusPublished - May 15 1993

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Organic Chemicals
Superconducting films
Texturing
Organic chemicals
metalorganic chemical vapor deposition
Chemical vapor deposition
Metals
Electrons
Substrates
thin films
Transmission electron microscopy
metals
Scanning electron microscopy
electrons
x rays
transmission electron microscopy
scanning electron microscopy
X ray diffraction
spectroscopy
Magnetization

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

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title = "Transmission electron microscopic characterization of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca1Cu2Oχ thin films on Au substrates. Evidence for Au-Cu alloy formation and texturing on a nonplanar metal substrate",
abstract = "The microstructure of superconducting Tl2Ba2Ca1Cu2Oχ thin films grown on Au substrates by metal-organic chemical vapor deposition (MOCVD) has been investigated. Characterization techniques included X-ray diffraction, variable temperature magnetization, scanning and transmission electron microscopy (SEM and TEM, respectively) and energy dispersive X-ray spectroscopy (EDX) measurements. The films exhibit a magnetically derived Tc≈80 K and a high degree of texturing with the crystallite c-axis oriented perpendicular to the Au substrate surface as evidenced by enhanced (00l) X-ray diffraction reflections. SEM/ EDX and TEM/EDX provide evidence of Au-Cu alloy formation but no Au diffusion into the film. The superconducting grains exhibit good compositional uniformity and excellent alignment with the substrate, even though the Au substrates were not smooth and exhibited a moderate density of steps.",
author = "Jieguang Hu and Miller, {Dean J.} and Schulz, {Douglas L.} and Bin Han and Neumayer, {Deborah A.} and Hinds, {Bruce J.} and Marks, {Tobin J}",
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T1 - Transmission electron microscopic characterization of metal-organic chemical vapor deposition-derived superconducting Tl2Ba2Ca1Cu2Oχ thin films on Au substrates. Evidence for Au-Cu alloy formation and texturing on a nonplanar metal substrate

AU - Hu, Jieguang

AU - Miller, Dean J.

AU - Schulz, Douglas L.

AU - Han, Bin

AU - Neumayer, Deborah A.

AU - Hinds, Bruce J.

AU - Marks, Tobin J

PY - 1993/5/15

Y1 - 1993/5/15

N2 - The microstructure of superconducting Tl2Ba2Ca1Cu2Oχ thin films grown on Au substrates by metal-organic chemical vapor deposition (MOCVD) has been investigated. Characterization techniques included X-ray diffraction, variable temperature magnetization, scanning and transmission electron microscopy (SEM and TEM, respectively) and energy dispersive X-ray spectroscopy (EDX) measurements. The films exhibit a magnetically derived Tc≈80 K and a high degree of texturing with the crystallite c-axis oriented perpendicular to the Au substrate surface as evidenced by enhanced (00l) X-ray diffraction reflections. SEM/ EDX and TEM/EDX provide evidence of Au-Cu alloy formation but no Au diffusion into the film. The superconducting grains exhibit good compositional uniformity and excellent alignment with the substrate, even though the Au substrates were not smooth and exhibited a moderate density of steps.

AB - The microstructure of superconducting Tl2Ba2Ca1Cu2Oχ thin films grown on Au substrates by metal-organic chemical vapor deposition (MOCVD) has been investigated. Characterization techniques included X-ray diffraction, variable temperature magnetization, scanning and transmission electron microscopy (SEM and TEM, respectively) and energy dispersive X-ray spectroscopy (EDX) measurements. The films exhibit a magnetically derived Tc≈80 K and a high degree of texturing with the crystallite c-axis oriented perpendicular to the Au substrate surface as evidenced by enhanced (00l) X-ray diffraction reflections. SEM/ EDX and TEM/EDX provide evidence of Au-Cu alloy formation but no Au diffusion into the film. The superconducting grains exhibit good compositional uniformity and excellent alignment with the substrate, even though the Au substrates were not smooth and exhibited a moderate density of steps.

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