Transport and defect mechanisms in cuprous delafossites. 2. CuScO 2 and CuYO2

Brian J. Ingram, Bryan J. Harder, Nikolas W. Hrabe, Thomas O Mason, Kenneth R Poeppelmeier

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Abstract

The delafossite structure (ABO2) accommodates a wide range of transition and rare-earth cations on the B-site in combination with a short list of A-site cations. This paper reports the effects on defect chemistry and transport as a function of the B-site cation in copper-based delafossite materials, with CuScO2 and CuYO2 as examples. Large B-site cation delafossites exhibit small polaron conduction, a diffusion-limited conduction mechanism, with an activation energy approximately twice that of CuAlO2 (0.22 eV vs 0.14 eV, respectively). The mobility for these materials is found to be <1 cm2 V-1 s-1, further evidence of small polaron conduction. The majority defect species is highly dependent on the B-site cation, such that CuScO2 and CuYO 2 are dominated by extrinsic defects (acceptor doping) and free oxygen interstitials, whereas off-stoichiometry dominates CuAlO2. Dopant solubility is shown to be 1% for bulk CuScO2 samples and lower in CuYO2.

Original languageEnglish
Pages (from-to)5623-5629
Number of pages7
JournalChemistry of Materials
Volume16
Issue number26
DOIs
Publication statusPublished - Dec 28 2004

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Cations
Positive ions
Defects
Gene Conversion
Doping (additives)
Stoichiometry
Rare earths
Copper
Solubility
Activation energy
Oxygen
CuAlO(2)

ASJC Scopus subject areas

  • Materials Chemistry
  • Materials Science(all)

Cite this

Transport and defect mechanisms in cuprous delafossites. 2. CuScO 2 and CuYO2. / Ingram, Brian J.; Harder, Bryan J.; Hrabe, Nikolas W.; Mason, Thomas O; Poeppelmeier, Kenneth R.

In: Chemistry of Materials, Vol. 16, No. 26, 28.12.2004, p. 5623-5629.

Research output: Contribution to journalArticle

Ingram, Brian J. ; Harder, Bryan J. ; Hrabe, Nikolas W. ; Mason, Thomas O ; Poeppelmeier, Kenneth R. / Transport and defect mechanisms in cuprous delafossites. 2. CuScO 2 and CuYO2. In: Chemistry of Materials. 2004 ; Vol. 16, No. 26. pp. 5623-5629.
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