TY - JOUR
T1 - Twinned domains in epitaxial ZnO/SnO2-cosubstituted In2O3 thin films
AU - Zhang, M.
AU - Buchholz, D. B.
AU - Xie, S. J.
AU - Chang, R. P.H.
N1 - Funding Information:
This project was supported by NREL and NSF (DMR-0071737) at the Materials Research Center of Northwestern University. The authors greatly appreciate Dr. Shuyou Li's help. TEM was performed in the EPIC facility of NUANCE Center at Northwestern University. NUANCE Center is supported by NSF-NSEC, NSF-MRSEC, Keck Foundation, the State of Illinois, and Northwestern University.
PY - 2007/10/15
Y1 - 2007/10/15
N2 - Zn0.3In1.4Sn0.3O3-δ (ZITO) thin films were grown by computer-controlled pulsed laser deposition (PLD) on (0 0 0 1) Al2O3 substrate. Cross-section and plan-view transmission electron microscopy (TEM) revealed that the ZITO films were composed of twin-related domains with their (2 2 2) planes parallel to (0 0 0 1) planes of the Al2O3 substrate. ZITO {5 over(5, -) 0} planes fitted well to Al2O3{3 over(3, -) 0 0} planes with a lattice mismatch of approximately 2.8%. Remarkable enhancement of electrical conductivity, about one order of magnitude higher than that of bulk ZITO, was found. The formation of twin-related domains and its effects on electrical and optical properties of ZITO films were also discussed.
AB - Zn0.3In1.4Sn0.3O3-δ (ZITO) thin films were grown by computer-controlled pulsed laser deposition (PLD) on (0 0 0 1) Al2O3 substrate. Cross-section and plan-view transmission electron microscopy (TEM) revealed that the ZITO films were composed of twin-related domains with their (2 2 2) planes parallel to (0 0 0 1) planes of the Al2O3 substrate. ZITO {5 over(5, -) 0} planes fitted well to Al2O3{3 over(3, -) 0 0} planes with a lattice mismatch of approximately 2.8%. Remarkable enhancement of electrical conductivity, about one order of magnitude higher than that of bulk ZITO, was found. The formation of twin-related domains and its effects on electrical and optical properties of ZITO films were also discussed.
KW - A1. Defects and interfaces
KW - A1. Orientation relationship
KW - A1. Transmission electron microscopy
KW - B1. Transparent conducting oxide thin films
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U2 - 10.1016/j.jcrysgro.2007.08.006
DO - 10.1016/j.jcrysgro.2007.08.006
M3 - Article
AN - SCOPUS:35348866113
VL - 308
SP - 376
EP - 381
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
SN - 0022-0248
IS - 2
ER -