Ultrafast photostriction in thin film bismuth ferrite and its correlation to electronic dynamics

Yuelin Li, Haidan Wen, Pice Chen, Margaret P. Cosgriff, Donald Walko, June Hyuk Lee, Carolina Adamo, Richard D Schaller, Clare Rowland, Christian Schlepuetz, Eric Dufresne, Qingteng Zhang, Carlos Giles, Darrell Schlom, John Freeland, Paul Evans

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A series of laser pump, x-ray probe experiments show that above band gap photoexcitation can generate a large out-of-plane strain in multiferroic BiFeO3 thin films. The strain decays in a time scale that is the same as the photo-induced carriers measured in an optical transient absorption spectroscopy experiment. We attribute the strain to the piezoelectric effect due to screening of the depolarization field by laser induced carriers. A strong film thickness dependence of strain and carrier relaxation is also observed, revealing the role of the carrier transport in determining the structural and carrier dynamics in complex oxide thin films.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherMaterials Research Society
Pages25-30
Number of pages6
Volume1528
ISBN (Print)9781632661180
DOIs
Publication statusPublished - 2013
Event2012 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 25 2012Nov 30 2012

Other

Other2012 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/25/1211/30/12

Fingerprint

Bismuth
bismuth
Ferrite
ferrites
Thin films
thin films
electronics
Piezoelectricity
dynamic structural analysis
Carrier transport
Lasers
Photoexcitation
plane strain
Depolarization
photoexcitation
Absorption spectroscopy
depolarization
Oxide films
lasers
Film thickness

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Li, Y., Wen, H., Chen, P., Cosgriff, M. P., Walko, D., Lee, J. H., ... Evans, P. (2013). Ultrafast photostriction in thin film bismuth ferrite and its correlation to electronic dynamics. In Materials Research Society Symposium Proceedings (Vol. 1528, pp. 25-30). Materials Research Society. https://doi.org/10.1557/opl.2013.396

Ultrafast photostriction in thin film bismuth ferrite and its correlation to electronic dynamics. / Li, Yuelin; Wen, Haidan; Chen, Pice; Cosgriff, Margaret P.; Walko, Donald; Lee, June Hyuk; Adamo, Carolina; Schaller, Richard D; Rowland, Clare; Schlepuetz, Christian; Dufresne, Eric; Zhang, Qingteng; Giles, Carlos; Schlom, Darrell; Freeland, John; Evans, Paul.

Materials Research Society Symposium Proceedings. Vol. 1528 Materials Research Society, 2013. p. 25-30.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, Y, Wen, H, Chen, P, Cosgriff, MP, Walko, D, Lee, JH, Adamo, C, Schaller, RD, Rowland, C, Schlepuetz, C, Dufresne, E, Zhang, Q, Giles, C, Schlom, D, Freeland, J & Evans, P 2013, Ultrafast photostriction in thin film bismuth ferrite and its correlation to electronic dynamics. in Materials Research Society Symposium Proceedings. vol. 1528, Materials Research Society, pp. 25-30, 2012 MRS Fall Meeting, Boston, MA, United States, 11/25/12. https://doi.org/10.1557/opl.2013.396
Li Y, Wen H, Chen P, Cosgriff MP, Walko D, Lee JH et al. Ultrafast photostriction in thin film bismuth ferrite and its correlation to electronic dynamics. In Materials Research Society Symposium Proceedings. Vol. 1528. Materials Research Society. 2013. p. 25-30 https://doi.org/10.1557/opl.2013.396
Li, Yuelin ; Wen, Haidan ; Chen, Pice ; Cosgriff, Margaret P. ; Walko, Donald ; Lee, June Hyuk ; Adamo, Carolina ; Schaller, Richard D ; Rowland, Clare ; Schlepuetz, Christian ; Dufresne, Eric ; Zhang, Qingteng ; Giles, Carlos ; Schlom, Darrell ; Freeland, John ; Evans, Paul. / Ultrafast photostriction in thin film bismuth ferrite and its correlation to electronic dynamics. Materials Research Society Symposium Proceedings. Vol. 1528 Materials Research Society, 2013. pp. 25-30
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