Unraveling the Near- and Far-Field Relationship of 2D Surface-Enhanced Raman Spectroscopy Substrates Using Wavelength-Scan Surface-Enhanced Raman Excitation Spectroscopy

Dmitry Kurouski, Nicolas Large, Naihao Chiang, Anne Isabelle Henry, Tamar Seideman, George C Schatz, Richard P. Van Duyne

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Lithographic and nonlithographic two-dimensional (2D) substrates for surface-enhanced Raman spectroscopy (SERS) have gained enormous popularity as analytical platforms for detection and identification of various analytes. However, their near- and far-field properties in most cases remain poorly understood. We have previously developed a metal nanopillar film over nanospheres (FON) platform exhibiting Raman enhancement factors of ∼107. These substrates have a reproducible and predictable localized surface plasmon resonance throughout the entire visible region and much of the near-IR region of the electromagnetic spectrum. Extending upon these results, we have utilized wavelength-scan surface-enhanced Raman excitation spectroscopy to unravel the relationship between near- and far-field properties of FON surface-enhanced Raman spectroscopy substrates. We examined by scanning electron microscopy FONs fabricated by either stationary (ST-FONs) or spun (SP-FONs) metal deposition to examine the interrelationships of nanoscale structure and near- and far-fied properties. We demonstrate that the line width and spectral position of the far-field and near-field resonances of ST- and SP-FONs directly depend on the nanofeature distribution at the metallic surface. In particular, we show that the actual nanofeature morphology and distribution directly impact the spectral alignment of the far-field and near-field resonances.

Original languageEnglish
Pages (from-to)14737-14744
Number of pages8
JournalJournal of Physical Chemistry C
Volume121
Issue number27
DOIs
Publication statusPublished - Jul 13 2017

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Raman spectroscopy
far fields
near fields
Spectroscopy
Wavelength
Nanospheres
Substrates
wavelengths
spectroscopy
excitation
platforms
Metals
electromagnetic spectra
Surface plasmon resonance
metal films
surface plasmon resonance
Linewidth
alignment
Scanning electron microscopy
scanning electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Energy(all)
  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films

Cite this

Unraveling the Near- and Far-Field Relationship of 2D Surface-Enhanced Raman Spectroscopy Substrates Using Wavelength-Scan Surface-Enhanced Raman Excitation Spectroscopy. / Kurouski, Dmitry; Large, Nicolas; Chiang, Naihao; Henry, Anne Isabelle; Seideman, Tamar; Schatz, George C; Van Duyne, Richard P.

In: Journal of Physical Chemistry C, Vol. 121, No. 27, 13.07.2017, p. 14737-14744.

Research output: Contribution to journalArticle

Kurouski, Dmitry ; Large, Nicolas ; Chiang, Naihao ; Henry, Anne Isabelle ; Seideman, Tamar ; Schatz, George C ; Van Duyne, Richard P. / Unraveling the Near- and Far-Field Relationship of 2D Surface-Enhanced Raman Spectroscopy Substrates Using Wavelength-Scan Surface-Enhanced Raman Excitation Spectroscopy. In: Journal of Physical Chemistry C. 2017 ; Vol. 121, No. 27. pp. 14737-14744.
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