Valence Instabilities, Phase Transitions, and Abrupt Lattice Expansion at 5 K in the YbGaGe System

Serena Margadonna, Kosmas Prassides, Andrew N. Fitch, James R. Salvador, Mercouri G Kanatzidis

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The powder synchrotron X-ray diffraction technique was used to study the thermal expansion behavior of the mixed valence layered compound, YbGa1.05Ge0.95 in the temperature range 3?1123 K. A surprising abrupt isosymmetric phase transition, accompanied by a dramatic volume increase (negative thermal expansion), was found at 5 K induced by a sudden Yb valence transition from +(2 + ε) toward +2. At high temperatures, the material undergoes a transformation to a highly disordered structure until it eventually collapses at 1123 K to a structure with isovalent Yb ions and flat Ga/Ge planes (AlB2 type).

Original languageEnglish
Pages (from-to)4498-4499
Number of pages2
JournalJournal of the American Chemical Society
Volume126
Issue number14
DOIs
Publication statusPublished - Apr 14 2004

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Phase Transition
Hot Temperature
Phase transitions
Synchrotrons
Temperature
X-Ray Diffraction
Powders
Thermal expansion
Ions
X ray diffraction
Negative thermal expansion

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Valence Instabilities, Phase Transitions, and Abrupt Lattice Expansion at 5 K in the YbGaGe System. / Margadonna, Serena; Prassides, Kosmas; Fitch, Andrew N.; Salvador, James R.; Kanatzidis, Mercouri G.

In: Journal of the American Chemical Society, Vol. 126, No. 14, 14.04.2004, p. 4498-4499.

Research output: Contribution to journalArticle

Margadonna, Serena ; Prassides, Kosmas ; Fitch, Andrew N. ; Salvador, James R. ; Kanatzidis, Mercouri G. / Valence Instabilities, Phase Transitions, and Abrupt Lattice Expansion at 5 K in the YbGaGe System. In: Journal of the American Chemical Society. 2004 ; Vol. 126, No. 14. pp. 4498-4499.
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