X-Ray absorption spectroscopy study of copper doped ZnO thin films

Qing Ma, D. B. Buchholz, Mark Anderson, Larry Aagesen, R. P.H. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

X-ray absorption spectroscopy technique is used to study copper-doped ZnO thin films, prepared by pulsed-laser deposition. The samples with various doping levels are examined. It is found that the samples contain metallic clusters with the sizes ≤ 2 nm as well as Cu1+ and Cu2+ states. The Cu1+ states exist as stable oxide clusters, while the Cu 2+ ones participate in the ZnO lattice some of which may be pertaining to the surfaces of the Cu clusters as well. The copper clusters of ∼1 nm are unstable and fragment under monochromatic x-ray beam illumination.

Original languageEnglish
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
Pages493-495
Number of pages3
DOIs
Publication statusPublished - 2007
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: Jul 9 2006Jul 14 2006

Publication series

NameAIP Conference Proceedings
Volume882
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
CountryUnited States
CityStanford, CA
Period7/9/067/14/06

Keywords

  • Cluster
  • Copper-doped ZnO
  • EXAFS
  • X-ray absorption
  • XANES

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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