X-ray standing wave imaging of atoms at interfaces

Michael Bedzyk, Chang Yong Kim, Alexander Kazimirov, Jeffrey Elam, Steve Christensen, Dipak Goswami, Mark Hersam, Michael Pellin, Peter Stair

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes
Pages337-361
Number of pages25
Publication statusPublished - Dec 1 2006
Event2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes - Boston, MA, United States
Duration: Nov 27 2006Dec 1 2006

Publication series

NameMaterials Research Society Symposium Proceedings
Volume967
ISSN (Print)0272-9172

Other

Other2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes
CountryUnited States
CityBoston, MA
Period11/27/0612/1/06

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Bedzyk, M., Kim, C. Y., Kazimirov, A., Elam, J., Christensen, S., Goswami, D., Hersam, M., Pellin, M., & Stair, P. (2006). X-ray standing wave imaging of atoms at interfaces. In Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes (pp. 337-361). (Materials Research Society Symposium Proceedings; Vol. 967).